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Atomic-Scale Analytical Tomography: Concepts and Implications

Hardback

Main Details

Title Atomic-Scale Analytical Tomography: Concepts and Implications
Authors and Contributors      By (author) Thomas F. Kelly
By (author) Brian P. Gorman
By (author) Simon P. Ringer
SeriesAdvances in Microscopy and Microanalysis
Physical Properties
Format:Hardback
Pages:300
Dimensions(mm): Height 250,Width 175
Category/GenreMechanical engineering and materials
Materials science
ISBN/Barcode 9781107162501
ClassificationsDewey:502.825
Audience
General

Publishing Details

Publisher Cambridge University Press
Imprint Cambridge University Press
Publication Date 24 March 2022
Publication Country United Kingdom

Description

A comprehensive guide on Atomic-Scale Analytical Tomography (ASAT) that discusses basic concepts and implications of the technique in areas such as material sciences, microscopy, engineering sciences and several interdisciplinary avenues. The title interrogates how to successfully achieve ASAT at the intersection of transmission electron microscopy and atom probe microscopy. This novel concept is capable of identifying individual atoms in large volumes as well as in 3D, with high spatial resolution. Written by leading experts from academia and industry, this book serves as a guide with real-world applications on cutting-edge research problems. An essential reading for researchers, engineers and practitioners interested in nanoscale characterisation, this book introduces the reader to a new direction for atomic-scale microscopy.

Author Biography

Thomas F. Kelly is a pioneer in the field of atomic-scale research. He was a professor of Materials Science and Engineering at the University of Wisconsin-Madison for 18 years prior to founding Imago Scientific Instruments (later acquired by CAMECA) to commercialize his invention, the local electrode atom probe (LEAP). Currently, Dr Kelly is Founder and CEO of Steam Instruments, Inc., is a Fellow of the Microscopy Society of America, the International Field Emission Society, the Microanalysis Society, and the Korean Society for Microscopy. He was recently elected to the US National Academy of Engineering. Brian P. Gorman is a Professor of Metallurgical and Materials Engineering at the Colorado School of Mines. His group has been developing experimental methods, hardware, and data analysis techniques for correlative electron microscopy and atom probe tomography since 2006. Simon P. Ringer is an engineer and leading researcher in atomic-scale materials design. A Professor in materials engineering in the School of Aerospace, Mechanical and Mechatronic Engineering, and an academic member and former Director of the Australian Centre for Microscopy & Microanalysis at the University of Sydney, he is presently Director of the Core Research Facilities at the University. He is a Fellow of the Institution of Engineers Australia, and a Fellow of the Australian Academy of Technology and Engineering.

Reviews

'The quest for making better materials is ultimately linked to understanding the role of each individual atom in its place and its chemical environment. Three pioneers in the field guide us through a comprehensive scenario of how this can be achieved by combining the two most advanced atomic-scale characterization techniques: atom probe tomography and transmission electron microscopy.' Joachrim Mayer, RWTH Aachen University