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Modeling Nanowire and Double-Gate Junctionless Field-Effect Transistors

Hardback

Main Details

Title Modeling Nanowire and Double-Gate Junctionless Field-Effect Transistors
Authors and Contributors      By (author) Farzan Jazaeri
By (author) Jean-Michel Sallese
Physical Properties
Format:Hardback
Pages:252
Dimensions(mm): Height 254,Width 178
Category/GenreNanotechnology
Electronics engineering
ISBN/Barcode 9781107162044
ClassificationsDewey:621.3815284
Audience
Undergraduate
Postgraduate, Research & Scholarly
Illustrations 7 Tables, black and white; 5 Halftones, black and white; 117 Line drawings, black and white

Publishing Details

Publisher Cambridge University Press
Imprint Cambridge University Press
Publication Date 1 March 2018
Publication Country United Kingdom

Description

The first book on the topic, this is a comprehensive introduction to the modeling and design of junctionless field effect transistors (FETs). Beginning with a discussion of the advantages and limitations of the technology, the authors also provide a thorough overview of published analytical models for double-gate and nanowire configurations, before offering a general introduction to the EPFL charge-based model of junctionless FETs. Important features are introduced gradually, including nanowire versus double-gate equivalence, technological design space, junctionless FET performances, short channel effects, transcapacitances, asymmetric operation, thermal noise, interface traps, and the junction FET. Additional features compatible with biosensor applications are also discussed. This is a valuable resource for students and researchers looking to understand more about this new and fast developing field.

Author Biography

Farzan Jazaeri is a Scientist at the Ecole Polytechnique Federale de Lausanne where his research interests focus on semiconductor devices and physics, and particularly the modeling and fabrication of field-effect transistors. Jean-Michel Sallese is a Senior Scientist at the Ecole Polytechnique Federale de Lausanne. He specialises in the analytical modeling of bulk and multigate field-effect transistors.